2D‐RIXS: resonant inelastic X‐ray scattering microscopy with high energy and spatial resolutions.
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| Title: | 2D‐RIXS: resonant inelastic X‐ray scattering microscopy with high energy and spatial resolutions. |
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| Authors: | Yamamoto, Kohei1 (AUTHOR), Suzuki, Hakuto2,3 (AUTHOR) hakuto.suzuki@tohoku.ac.jp, Miyawaki, Jun1 (AUTHOR) miyawaki.jun@qst.go.jp |
| Source: | Journal of Synchrotron Radiation. May2026, Vol. 33 Issue 3, p739-745. 7p. |
| Subjects: | Spatial resolution, X-ray scattering, X-ray reflection, Condensed matter, High resolution imaging, Spectrometers |
| Abstract: | A two‐dimensional resonant inelastic X‐ray scattering (2D‐RIXS) microscopy system has been developed at beamline BL02U of NanoTerasu. The instrument combines a Wolter type‐I mirror for spatial imaging with a varied‐line‐spacing grating spectrometer, simultaneously achieving micrometre‐scale spatial resolution and ultrahigh energy resolution in the soft X‐ray regime. Test chart measurements confirm a vertical spatial resolution of 1.0 µm near the field‐of‐view center, and the horizontal resolution determined by the incident beam footprint is 0.8 µm. RIXS imaging capabilities have been demonstrated by the measurements of a patterned NanoTerasu logo and exfoliated NiPS3 nanoflakes, highlighting its efficiency in locating specific microscale regions within inhomogeneous samples. These results establish 2D‐RIXS microscopy as a position‐sensitive probe of elementary excitations in quantum materials and functional devices. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Abstract: | A two‐dimensional resonant inelastic X‐ray scattering (2D‐RIXS) microscopy system has been developed at beamline BL02U of NanoTerasu. The instrument combines a Wolter type‐I mirror for spatial imaging with a varied‐line‐spacing grating spectrometer, simultaneously achieving micrometre‐scale spatial resolution and ultrahigh energy resolution in the soft X‐ray regime. Test chart measurements confirm a vertical spatial resolution of 1.0 µm near the field‐of‐view center, and the horizontal resolution determined by the incident beam footprint is 0.8 µm. RIXS imaging capabilities have been demonstrated by the measurements of a patterned NanoTerasu logo and exfoliated NiPS3 nanoflakes, highlighting its efficiency in locating specific microscale regions within inhomogeneous samples. These results establish 2D‐RIXS microscopy as a position‐sensitive probe of elementary excitations in quantum materials and functional devices. [ABSTRACT FROM AUTHOR] |
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| ISSN: | 09090495 |
| DOI: | 10.1107/S1600577526000573 |
