Thin film analysis by X-ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-31052-4.

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Bibliographic Details
Title:	Thin film analysis by X-ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-31052-4.
Authors:	Chateigner, Daniel¹
Source:	Journal of Applied Crystallography. Dec2006, Vol. 39 Issue 6, p925-926. 2p.
Subjects:	Thin Film Analysis by X-Ray Scattering (Book), Birkholz, Mario, Fewster, F., Genzel, C., Thin films, Nonfiction
Abstract:	The article reviews the book "Thin Film Analysis by X-ray scattering," by Mario Birkholz with contributions by P. F. Fewster and C. Genzel.
Database:	Engineering Source

Description
Abstract:	The article reviews the book "Thin Film Analysis by X-ray scattering," by Mario Birkholz with contributions by P. F. Fewster and C. Genzel.
ISSN:	00218898
DOI:	10.1107/S0021889806034698