Bibliographic Details
| Title: |
Post-annealing temperature dependence of infrared absorption enhancement of polymer on evaporated silver films |
| Authors: |
Suzuki, Y.1 uc@cc.hirosaki-u.ac.jp, Ojima, Y.1, Fukui, Y.1, Fazyia, H.1, Sagisaka, K.2 |
| Source: |
Thin Solid Films. Jan2007, Vol. 515 Issue 5, p3073-3078. 6p. |
| Subjects: |
Annealing of metals, Absorption, Polymers, Thin films |
| Abstract: |
Abstract: Infrared absorption spectra were measured at normal incidence of radiation for polymers on post-annealed silver films of 4–10 nm mass thicknesses that had been deposited in ultra high vacuum onto Si substrate surfaces. Results show that the polymer absorption intensity depends on the annealing temperature and the silver mass thickness. Results clarified that no simple relation existed, such as a negative correlation between reflectivity and the infrared absorption enhancement, even when the mass thickness was made constant and the silver particles'' size and shape were changed. For infrared absorption intensity to become large, particles must be positioned discretely, but if the distance between particles is too large, absorption intensity decreases. Moreover, results verified that optimal thin-film morphology was different according to the wavelength region. [Copyright &y& Elsevier] |
|
Copyright of Thin Solid Films is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |
