ITC 2006 panels.
Saved in:
| Title: | ITC 2006 panels. |
|---|---|
| Authors: | Stolicny, Carol1 |
| Source: | IEEE Design & Test of Computers. Jan/Feb2007, Vol. 24 Issue 1, p94-96. 3p. |
| Subjects: | Computers testing, Standards, Conferences & conventions |
| Abstract: | The article presents summaries of five panel discussion sessions from the 2006 International Test Conference. "Behind Closed Doors with Test Experts" is by Rohit Kapur. "Zero Defects: Mission Impossible?, is from Erik Jan Marinissen and Sandeep K. Goel. "Changing Test Industry: Analysts' Perspective" is by Amy Gold and Rochit Rajsuman. |
| Database: | Engineering Source |
| Abstract: | The article presents summaries of five panel discussion sessions from the 2006 International Test Conference. "Behind Closed Doors with Test Experts" is by Rohit Kapur. "Zero Defects: Mission Impossible?, is from Erik Jan Marinissen and Sandeep K. Goel. "Changing Test Industry: Analysts' Perspective" is by Amy Gold and Rochit Rajsuman. |
|---|---|
| ISSN: | 07407475 |
| DOI: | 10.1109/MDT.2007.20 |
