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ITC 2006 panels.

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Bibliographic Details
Title: ITC 2006 panels.
Authors: Stolicny, Carol1
Source: IEEE Design & Test of Computers. Jan/Feb2007, Vol. 24 Issue 1, p94-96. 3p.
Subjects: Computers testing, Standards, Conferences & conventions
Abstract: The article presents summaries of five panel discussion sessions from the 2006 International Test Conference. "Behind Closed Doors with Test Experts" is by Rohit Kapur. "Zero Defects: Mission Impossible?, is from Erik Jan Marinissen and Sandeep K. Goel. "Changing Test Industry: Analysts' Perspective" is by Amy Gold and Rochit Rajsuman.
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 25554222
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Design+%26+Test+of+Computers%22">IEEE Design & Test of Computers</searchLink>. Jan/Feb2007, Vol. 24 Issue 1, p94-96. 3p.
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  Data: The article presents summaries of five panel discussion sessions from the 2006 International Test Conference. "Behind Closed Doors with Test Experts" is by Rohit Kapur. "Zero Defects: Mission Impossible?, is from Erik Jan Marinissen and Sandeep K. Goel. "Changing Test Industry: Analysts' Perspective" is by Amy Gold and Rochit Rajsuman.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=25554222
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/MDT.2007.20
    Languages:
      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 94
    Subjects:
      – SubjectFull: Computers testing
        Type: general
      – SubjectFull: Standards
        Type: general
      – SubjectFull: Conferences & conventions
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      – TitleFull: ITC 2006 panels.
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              Text: Jan/Feb2007
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              Y: 2007
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              Value: 24
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