Bibliographic Details
| Title: |
Threshold LET for SEU Induced by Low Energy Ions. |
| Authors: |
McNulty, P.J., Roche, Ph. |
| Source: |
IEEE Transactions on Nuclear Science. Dec99 Part 1 of 4, Vol. 46 Issue 6, p1370. 8p. 1 Chart, 7 Graphs. |
| Subjects: |
Linear energy transfer, Ions |
| Abstract: |
Presents information on a study which determined the threshold linear energy transfer as a function for single event upset (SEU) induced by low energy ions. Predictions of SEU rate using First Order Model (FOM); Second Order Model (SOM) of SEU; Comparison of the results of the FOM and SOM models; Conclusions. |
| Database: |
Engineering Source |
