Threshold LET for SEU Induced by Low Energy Ions.
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| Title: | Threshold LET for SEU Induced by Low Energy Ions. |
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| Authors: | McNulty, P.J., Roche, Ph. |
| Source: | IEEE Transactions on Nuclear Science. Dec99 Part 1 of 4, Vol. 46 Issue 6, p1370. 8p. 1 Chart, 7 Graphs. |
| Subjects: | Linear energy transfer, Ions |
| Abstract: | Presents information on a study which determined the threshold linear energy transfer as a function for single event upset (SEU) induced by low energy ions. Predictions of SEU rate using First Order Model (FOM); Second Order Model (SOM) of SEU; Comparison of the results of the FOM and SOM models; Conclusions. |
| Database: | Engineering Source |
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