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Two-dimensional cell parameters measurement of nematic liquid crystal using optical interferometry and Fourier transform fringe analysis technique

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Title: Two-dimensional cell parameters measurement of nematic liquid crystal using optical interferometry and Fourier transform fringe analysis technique
Authors: Inam, M.1, Singh, G.1, Srivastava, V.1, Prakash, J.1, Joshi, T.2, Biradar, A.M.2, Mehta, D.S.1 dsmehta@iddc.iitd.ac.in
Source: Optics Communications. Nov2011, Vol. 284 Issue 23, p5448-5452. 5p.
Subjects: Liquid crystals, Optical interferometers, Fourier transform optics, Electric potential, Double refraction, Anisotropy, Refractive index, Equations
Abstract: Abstract: We report a method for the measurement of nematic liquid crystal (NLC) cell parameters i.e., switching voltage, birefringence, retardation, dielectric anisotropy, average tilt angle and change in refractive index with applied DC voltage to LC material. The proposed method is based on optical interferometry and Fourier transform fringe analysis technique, in which we obtain 2-dimensional (2D) phase map of the interferograms as a function of applied voltage. Mach–Zehnder interferometer (MZI) was used for the study of cell parameters and interferograms were recorded at different applied DC voltages to NLC cell using CCD camera. From the phase map, 2D-refractive index distribution of the LC cell with applied voltage was reconstructed. Analytical equations are derived based on optical interferometry and then solved to obtain cell parameters. The present method is fast and can give 2D-cell parameters from only two quick interferograms. [Copyright &y& Elsevier]
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Database: Engineering Source
Description
Abstract:Abstract: We report a method for the measurement of nematic liquid crystal (NLC) cell parameters i.e., switching voltage, birefringence, retardation, dielectric anisotropy, average tilt angle and change in refractive index with applied DC voltage to LC material. The proposed method is based on optical interferometry and Fourier transform fringe analysis technique, in which we obtain 2-dimensional (2D) phase map of the interferograms as a function of applied voltage. Mach–Zehnder interferometer (MZI) was used for the study of cell parameters and interferograms were recorded at different applied DC voltages to NLC cell using CCD camera. From the phase map, 2D-refractive index distribution of the LC cell with applied voltage was reconstructed. Analytical equations are derived based on optical interferometry and then solved to obtain cell parameters. The present method is fast and can give 2D-cell parameters from only two quick interferograms. [Copyright &y& Elsevier]
ISSN:00304018
DOI:10.1016/j.optcom.2011.08.003