Bibliographic Details
| Title: |
Wobble-based on-chip calibration circuit for temperature independent oscillators. |
| Authors: |
De Smedt, V.1, Steyaert, W.1, Dehaene, W.1, Gielen, G.1 |
| Source: |
Electronics Letters (Institution of Engineering & Technology). 8/2/2012, Vol. 48 Issue 16, p1000-1001. 2p. 2 Diagrams, 1 Graph. |
| Subjects: |
Electric oscillators, Timing circuits, Calibration, Temperature, Metal oxide semiconductors |
| Abstract: |
An automatic calibration circuit for temperature- and process-independent oscillators and timing circuits is presented. The circuit monitors the dynamic gate-source voltage of a MOS transistor of which the temperature is changing. By adapting the bias current through this transistor towards the zero-temperature-coefficient point of the VGS, the gate-source voltage can be used in temperature-independent timing circuits. Because of the dynamic nature of this regulation circuit, the technique is insensitive to mismatch and process variations. The presented technique is applied to a low-noise oscillator to make it less temperature sensitive with a factor of 8. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
