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Deposition dynamics of droplet-free Si nanoparticles in Ar gas using laser ablation

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Title: Deposition dynamics of droplet-free Si nanoparticles in Ar gas using laser ablation
Authors: Takeuchi, D.1 take@ims.tsukuba.ac.jp, Mizuta, T.1, Makimura, T.1, Yoshida, S.1, Fujita, M.1, Hata, K.2, Shigekawa, H.1, Murakami, K.1
Source: Applied Surface Science. Sep2002, Vol. 197/198 Issue 1-4, p674. 5p.
Subjects: Electric properties of silicon crystals, Pulsed laser deposition, Time-resolved spectroscopy, Nanoparticles
Abstract: Droplet-free deposition of Si nanoparticle films has been studied applying time-resolved imaging of Si nanoparticles formed by laser ablation of Si targets in Ar gas. We found that Si nanoparticles can be deposited not only on substrates facing to the targets but also on substrates placed beside the target. We further confirmed using a scanning tunneling microscope (STM), Si nanoparticles with sizes of 5–8 nm are deposited on substrates placed beside the target and using a scanning electron microscope (SEM) on the substrates, no droplets are observed. [Copyright &y& Elsevier]
Copyright of Applied Surface Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 7911910
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Deposition dynamics of droplet-free Si nanoparticles in Ar gas using laser ablation
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  Data: <searchLink fieldCode="AR" term="%22Takeuchi%2C+D%2E%22">Takeuchi, D.</searchLink><relatesTo>1</relatesTo><i> take@ims.tsukuba.ac.jp</i><br /><searchLink fieldCode="AR" term="%22Mizuta%2C+T%2E%22">Mizuta, T.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Makimura%2C+T%2E%22">Makimura, T.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Yoshida%2C+S%2E%22">Yoshida, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Fujita%2C+M%2E%22">Fujita, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Hata%2C+K%2E%22">Hata, K.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Shigekawa%2C+H%2E%22">Shigekawa, H.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Murakami%2C+K%2E%22">Murakami, K.</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Surface+Science%22">Applied Surface Science</searchLink>. Sep2002, Vol. 197/198 Issue 1-4, p674. 5p.
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  Data: <searchLink fieldCode="DE" term="%22Electric+properties+of+silicon+crystals%22">Electric properties of silicon crystals</searchLink><br /><searchLink fieldCode="DE" term="%22Pulsed+laser+deposition%22">Pulsed laser deposition</searchLink><br /><searchLink fieldCode="DE" term="%22Time-resolved+spectroscopy%22">Time-resolved spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Nanoparticles%22">Nanoparticles</searchLink>
– Name: Abstract
  Label: Abstract
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  Data: Droplet-free deposition of Si nanoparticle films has been studied applying time-resolved imaging of Si nanoparticles formed by laser ablation of Si targets in Ar gas. We found that Si nanoparticles can be deposited not only on substrates facing to the targets but also on substrates placed beside the target. We further confirmed using a scanning tunneling microscope (STM), Si nanoparticles with sizes of 5–8 nm are deposited on substrates placed beside the target and using a scanning electron microscope (SEM) on the substrates, no droplets are observed. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
  Label:
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  Data: <i>Copyright of Applied Surface Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – Type: doi
        Value: 10.1016/S0169-4332(02)00439-7
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        Text: English
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        Type: general
      – SubjectFull: Pulsed laser deposition
        Type: general
      – SubjectFull: Time-resolved spectroscopy
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      – SubjectFull: Nanoparticles
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              Text: Sep2002
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              Value: 197/198
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