Bibliographic Details
| Title: |
STM–AFM image formation on TiO2(1 1 0) 1×1 and 1×2 surfaces |
| Authors: |
Ke, S.H.1 shke@jrcat.or.jp, Uda, T.1, Terakura, K.2 |
| Source: |
Applied Surface Science. Mar2002, Vol. 188 Issue 3/4, p319. 6p. |
| Subjects: |
Titanium dioxide, Atomic force microscopy |
| Abstract: |
Ultra-soft pseudopotentials plane-wave technique is used to simulate the tip–sample interaction and STM–AFM image formation on TiO2(1 1 0) 1×1 and 1×2 surfaces. It is shown that the strong tip–oxygen chemical interaction determines the main feature of the AFM image formation. By checking the effects of tip-induced surface relaxation, spin polarization, and bias voltage, we show that it should be the significant tip-induced surface relaxation on the 1×1 surface which leads to the too small image corrugation observed experimentally on the 1×1 surface. [Copyright &y& Elsevier] |
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| Database: |
Engineering Source |
