View in EDS

Characterizing the Manifest Probability Distributions of Three Latent Trait Models for Accuracy and Response Time.

Saved in:
Bibliographic Details
Title: Characterizing the Manifest Probability Distributions of Three Latent Trait Models for Accuracy and Response Time.
Authors: Marsman, M.1 (AUTHOR) m.marsman@uva.nl, Sigurdardóttir, H.2 (AUTHOR), Bolsinova, M.3 (AUTHOR), Maris, G.1,3 (AUTHOR)
Source: Psychometrika. Sep2019, Vol. 84 Issue 3, p870-891. 22p.
Subject Terms: *Item response theory, Drift diffusion models, Latent variables, Probability theory
Geographic Terms: Netherlands
Abstract: In this paper we study the statistical relations between three latent trait models for accuracies and response times: the hierarchical model (HM) of van der Linden (Psychometrika 72(3):287–308, 2007), the signed residual time model (SM) proposed by Maris and van der Maas (Psychometrika 77(4):615–633, 2012), and the drift diffusion model (DM) as proposed by Tuerlinckx and De Boeck (Psychometrika 70(4):629–650, 2005). One important distinction between these models is that the HM and the DM either assume or imply that accuracies and response times are independent given the latent trait variables, while the SM does not. In this paper we investigate the impact of this conditional independence property—or a lack thereof—on the manifest probability distribution for accuracies and response times. We will find that the manifest distributions of the latent trait models share several important features, such as the dependency between accuracy and response time, but we also find important differences, such as in what function of response time is being modeled. Our method for characterizing the manifest probability distributions is related to the Dutch identity (Holland in Psychometrika 55(6):5–18, 1990). [ABSTRACT FROM AUTHOR]
Copyright of Psychometrika is the property of Cambridge University Press and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Education Research Complete
Description
Abstract:In this paper we study the statistical relations between three latent trait models for accuracies and response times: the hierarchical model (HM) of van der Linden (Psychometrika 72(3):287–308, 2007), the signed residual time model (SM) proposed by Maris and van der Maas (Psychometrika 77(4):615–633, 2012), and the drift diffusion model (DM) as proposed by Tuerlinckx and De Boeck (Psychometrika 70(4):629–650, 2005). One important distinction between these models is that the HM and the DM either assume or imply that accuracies and response times are independent given the latent trait variables, while the SM does not. In this paper we investigate the impact of this conditional independence property—or a lack thereof—on the manifest probability distribution for accuracies and response times. We will find that the manifest distributions of the latent trait models share several important features, such as the dependency between accuracy and response time, but we also find important differences, such as in what function of response time is being modeled. Our method for characterizing the manifest probability distributions is related to the Dutch identity (Holland in Psychometrika 55(6):5–18, 1990). [ABSTRACT FROM AUTHOR]
ISSN:00333123
DOI:10.1007/s11336-019-09668-3