Monte-Carlo Simulations to Quantify Neutron-Induced Multiple Bit Upsets in Advanced SRAMs.

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Bibliographic Details
Title: Monte-Carlo Simulations to Quantify Neutron-Induced Multiple Bit Upsets in Advanced SRAMs.
Authors: Mérelle, Thomas1 merelle@cem2.univ-montp2.fr, Saigné, F.2, Sagnes, B.2, Gasiot, G.1, Roche, Ph.1, Carrière, T.3, Palau, M.-C.3, Wrobel, F.4, Palau, J.-M.2
Source: IEEE Transactions on Nuclear Science. Oct2005 Part 2, Vol. 52 Issue 5, p1538-1544. 7p.
Database: Environment Complete
Description
ISSN:00189499
DOI:10.1109/TNS.2005.855823