APA (7th ed.) Citation

Mérelle, T., Saigné, F., Sagnes, B., Gasiot, G., Roche, P., Carrière, T., . . . Palau, J. (2005). Monte-Carlo Simulations to Quantify Neutron-Induced Multiple Bit Upsets in Advanced SRAMs. IEEE Transactions on Nuclear Science, 52(5), 1538. https://doi.org/10.1109/TNS.2005.855823

Chicago Style (17th ed.) Citation

Mérelle, Thomas, F. Saigné, B. Sagnes, G. Gasiot, Ph Roche, T. Carrière, M.-C Palau, F. Wrobel, and J.-M Palau. "Monte-Carlo Simulations to Quantify Neutron-Induced Multiple Bit Upsets in Advanced SRAMs." IEEE Transactions on Nuclear Science 52, no. 5 (2005): 1538. https://doi.org/10.1109/TNS.2005.855823.

MLA (9th ed.) Citation

Mérelle, Thomas, et al. "Monte-Carlo Simulations to Quantify Neutron-Induced Multiple Bit Upsets in Advanced SRAMs." IEEE Transactions on Nuclear Science, vol. 52, no. 5, 2005, p. 1538, https://doi.org/10.1109/TNS.2005.855823.