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Monte-Carlo Simulations to Quantify Neutron-Induced Multiple Bit Upsets in Advanced SRAMs.

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Title: Monte-Carlo Simulations to Quantify Neutron-Induced Multiple Bit Upsets in Advanced SRAMs.
Authors: Mérelle, Thomas1 merelle@cem2.univ-montp2.fr, Saigné, F.2, Sagnes, B.2, Gasiot, G.1, Roche, Ph.1, Carrière, T.3, Palau, M.-C.3, Wrobel, F.4, Palau, J.-M.2
Source: IEEE Transactions on Nuclear Science. Oct2005 Part 2, Vol. 52 Issue 5, p1538-1544. 7p.
Database: Environment Complete
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DbLabel: Environment Complete
An: 19242410
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PubType: Academic Journal
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Nuclear+Science%22">IEEE Transactions on Nuclear Science</searchLink>. Oct2005 Part 2, Vol. 52 Issue 5, p1538-1544. 7p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eih&AN=19242410
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        Value: 10.1109/TNS.2005.855823
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        Text: English
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      – TitleFull: Monte-Carlo Simulations to Quantify Neutron-Induced Multiple Bit Upsets in Advanced SRAMs.
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              Text: Oct2005 Part 2
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