Bibliographic Details
| Title: |
Discrete modelling of ion diffusion in clays with overlapped electrical double layers. |
| Authors: |
Qu, Yongxiao1 (AUTHOR), Li, Bo1 (AUTHOR), Wang, LiGe2 (AUTHOR), Yan, Huaxiang3 (AUTHOR), Bian, Kang4 (AUTHOR), Jivkov, Andrey P.5 (AUTHOR), Xiong, Qingrong1 (AUTHOR) qingrong.xiong@sdu.edu.cn |
| Source: |
Journal of Radioanalytical & Nuclear Chemistry. May2026, Vol. 335 Issue 5, p3937-3951. 15p. |
| Subject Terms: |
*Electric double layer, *Debye length, *Ion migration & velocity, *Ion mobility, *Clay, *Van der Waals forces, *Porosity, *Computer simulation |
| Abstract: |
The electrical double layer (EDL) critically influences ion transport prediction in clay, yet current models fail to accurately simulate diffusion in highly compacted clay across broad ionic strengths, especially low concentrations (e.g., 0.01 mol/L). This work proposes a robust model integrating a pore network approach with pore-specific ion transport. Pores are categorized into three types based on Debye length and EDL overlap degree. Van der Waals forces are incorporated for pores with severe EDL overlap. The numerical results predicted under a larger span of anion and cation concentration agree well with the experimental data. [ABSTRACT FROM AUTHOR] |
| Database: |
Energy & Power Source |
