Bibliographic Details
| Title: |
Quantitative off-axis electron holography of GaAs p-n junctions prepared by focused ion beam milling. |
| Authors: |
Cooper D; CEA LETI - Minatec, 17 rue des Martyrs, 38054 Grenoble, Cedex 9, France. david.cooper@cea.fr, Truche R, Twitchett-Harrison AC, Dunin-Borkowski RE, Midgley PA |
| Source: |
Journal of microscopy [J Microsc] 2009 Jan; Vol. 233 (1), pp. 102-13. |
| Publication Type: |
Journal Article; Research Support, Non-U.S. Gov't |
| Journal Info: |
Publisher: Published for the Royal Microscopical Society by Blackwell Scientific Publications Country of Publication: England NLM ID: 0204522 Publication Model: Print Cited Medium: Internet ISSN: 1365-2818 (Electronic) Linking ISSN: 00222720 NLM ISO Abbreviation: J Microsc Subsets: PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
