APA (7th ed.) Citation

D, C., R, T., AC, T., RE, D., & PA, M. (2009). Quantitative off-axis electron holography of GaAs p-n junctions prepared by focused ion beam milling. Journal of microscopy, 233(1), 102. https://doi.org/10.1111/j.1365-2818.2008.03101.x

Chicago Style (17th ed.) Citation

D, Cooper, Truche R, Twitchett-Harrison AC, Dunin-Borkowski RE, and Midgley PA. "Quantitative Off-axis Electron Holography of GaAs P-n Junctions Prepared by Focused Ion Beam Milling." Journal of Microscopy 233, no. 1 (2009): 102. https://doi.org/10.1111/j.1365-2818.2008.03101.x.

MLA (9th ed.) Citation

D, Cooper, et al. "Quantitative Off-axis Electron Holography of GaAs P-n Junctions Prepared by Focused Ion Beam Milling." Journal of Microscopy, vol. 233, no. 1, 2009, p. 102, https://doi.org/10.1111/j.1365-2818.2008.03101.x.