Bibliographic Details
| Title: |
Finite element simulations of electrostatic dopant potentials in thin semiconductor specimens for electron holography. |
| Authors: |
Somodi PK; Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, United Kingdom., Twitchett-Harrison AC, Midgley PA, Kardynał BE, Barnes CH, Dunin-Borkowski RE |
| Source: |
Ultramicroscopy [Ultramicroscopy] 2013 Nov; Vol. 134, pp. 160-6. Date of Electronic Publication: 2013 Jul 16. |
| Publication Type: |
Journal Article; Research Support, Non-U.S. Gov't |
| Journal Info: |
Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE |
| Database: |
MEDLINE Ultimate |
