Author Response: Neurological Hemifield Test in Binasal Defects.

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Bibliographic Details
Title: Author Response: Neurological Hemifield Test in Binasal Defects.
Authors: McCoy AN; Glaucoma Center of Excellence, Wilmer Eye Institute, Johns Hopkins University, Baltimore, Maryland, United States;, Quigley HA; Glaucoma Center of Excellence, Wilmer Eye Institute, Johns Hopkins University, Baltimore, Maryland, United States; 2Dana Center for Preventive Ophthalmology, Wilmer Eye Institute, Johns Hopkins University, Baltimore, Maryland, United States;, Miller NR; Neuro-Ophthalmology Service, Wilmer Eye Institute, Johns Hopkins University, Baltimore, Maryland, United States; and., Subramanian PS; Neuro-Ophthalmology Service, Wilmer Eye Institute, Johns Hopkins University, Baltimore, Maryland, United States; and., Ramulu PY; Glaucoma Center of Excellence, Wilmer Eye Institute, Johns Hopkins University, Baltimore, Maryland, United States; 2Dana Center for Preventive Ophthalmology, Wilmer Eye Institute, Johns Hopkins University, Baltimore, Maryland, United States;, Boland MV; Glaucoma Center of Excellence, Wilmer Eye Institute, Johns Hopkins University, Baltimore, Maryland, United States; 4Division of Health Sciences Informatics, Johns Hopkins University, Baltimore, Maryland, United States.
Source: Investigative ophthalmology & visual science [Invest Ophthalmol Vis Sci] 2015 Apr; Vol. 56 (4), pp. 2570.
Publication Type: Letter; Comment
Journal Info: Publisher: Association For Research In Vision And Ophthalmology (Arvo) Country of Publication: United States NLM ID: 7703701 Publication Model: Print Cited Medium: Internet ISSN: 1552-5783 (Electronic) Linking ISSN: 01460404 NLM ISO Abbreviation: Invest Ophthalmol Vis Sci Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1552-5783
DOI:10.1167/iovs.15-16824