Bibliographic Details
| Title: |
On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers. |
| Authors: |
Zhang S, Zhang C, Wang H, Liu Y, Peters JD, Bowers JE |
| Source: |
Optics express [Opt Express] 2017 Jun 12; Vol. 25 (12), pp. 13340-13350. |
| Publication Type: |
Journal Article |
| Journal Info: |
Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
