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On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers.

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Bibliographic Details
Title: On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers.
Authors: Zhang S, Zhang C, Wang H, Liu Y, Peters JD, Bowers JE
Source: Optics express [Opt Express] 2017 Jun 12; Vol. 25 (12), pp. 13340-13350.
Publication Type: Journal Article
Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Availability: 0
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DbLabel: MEDLINE Ultimate
An: 28788871
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Optica+Publishing+Group%22">Optica Publishing Group </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101137103 <i>Publication Model: </i>Print <i>Cited Medium: </i>Internet <i>ISSN: </i>1094-4087 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2210944087%22">10944087 </searchLink><i>NLM ISO Abbreviation: </i>Opt Express <i>Subsets: </i>PubMed not MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=28788871
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        Value: 10.1364/OE.25.013340
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      – Code: eng
        Text: English
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        StartPage: 13340
    Titles:
      – TitleFull: On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers.
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            NameFull: Zhang S
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            NameFull: Zhang C
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            NameFull: Wang H
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            NameFull: Liu Y
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            NameFull: Peters JD
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            NameFull: Bowers JE
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            – D: 12
              M: 06
              Text: 2017 Jun 12
              Type: published
              Y: 2017
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              Value: 25
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              Value: 12
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