APA (7th ed.) Citation

SX, W., YL, Z., DX, Z., H, S., P, L., JB, H., . . . CX, M. (2017). Genome-wide association study for grain yield and related traits in elite wheat varieties and advanced lines using SNP markers. PloS one, 12(11), e0188662. https://doi.org/10.1371/journal.pone.0188662

Chicago Style (17th ed.) Citation

SX, Wang, et al. "Genome-wide Association Study for Grain Yield and Related Traits in Elite Wheat Varieties and Advanced Lines Using SNP Markers." PloS One 12, no. 11 (2017): e0188662. https://doi.org/10.1371/journal.pone.0188662.

MLA (9th ed.) Citation

SX, Wang, et al. "Genome-wide Association Study for Grain Yield and Related Traits in Elite Wheat Varieties and Advanced Lines Using SNP Markers." PloS One, vol. 12, no. 11, 2017, p. e0188662, https://doi.org/10.1371/journal.pone.0188662.