In-situ reflectometry to monitor locally-catalyzed initiation and growth of nanowire assemblies.
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| Title: | In-situ reflectometry to monitor locally-catalyzed initiation and growth of nanowire assemblies. |
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| Authors: | Braun MR; Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, United States of America., Güniat L; Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland., Fontcuberta I Morral A; Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland., McIntyre PC; Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, United States of America. |
| Source: | Nanotechnology [Nanotechnology] 2020 Aug 14; Vol. 31 (33), pp. 335703. Date of Electronic Publication: 2020 Apr 28. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: IOP Pub Country of Publication: England NLM ID: 101241272 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1361-6528 (Electronic) Linking ISSN: 09574484 NLM ISO Abbreviation: Nanotechnology Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
| ISSN: | 1361-6528 |
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| DOI: | 10.1088/1361-6528/ab8def |
