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In-situ reflectometry to monitor locally-catalyzed initiation and growth of nanowire assemblies.

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Title: In-situ reflectometry to monitor locally-catalyzed initiation and growth of nanowire assemblies.
Authors: Braun MR; Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, United States of America., Güniat L; Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland., Fontcuberta I Morral A; Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland., McIntyre PC; Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, United States of America.
Source: Nanotechnology [Nanotechnology] 2020 Aug 14; Vol. 31 (33), pp. 335703. Date of Electronic Publication: 2020 Apr 28.
Publication Type: Journal Article
Journal Info: Publisher: IOP Pub Country of Publication: England NLM ID: 101241272 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1361-6528 (Electronic) Linking ISSN: 09574484 NLM ISO Abbreviation: Nanotechnology Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: <searchLink fieldCode="AU" term="%22Braun+MR%22">Braun MR</searchLink>; Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, United States of America.<br /><searchLink fieldCode="AU" term="%22Güniat+L%22">Güniat L</searchLink>; Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland.<br /><searchLink fieldCode="AU" term="%22Fontcuberta+I+Morral+A%22">Fontcuberta I Morral A</searchLink>; Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland.<br /><searchLink fieldCode="AU" term="%22McIntyre+PC%22">McIntyre PC</searchLink>; Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, United States of America.
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  Data: <searchLink fieldCode="JN" term="%22101241272%22">Nanotechnology</searchLink> [Nanotechnology] 2020 Aug 14; Vol. 31 (33), pp. 335703. <i>Date of Electronic Publication: </i>2020 Apr 28.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22IOP+Pub%22">IOP Pub </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101241272 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1361-6528 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2209574484%22">09574484 </searchLink><i>NLM ISO Abbreviation: </i>Nanotechnology <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1088/1361-6528/ab8def
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      – Code: eng
        Text: English
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        StartPage: 335703
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      – TitleFull: In-situ reflectometry to monitor locally-catalyzed initiation and growth of nanowire assemblies.
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            – D: 14
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              Text: 2020 Aug 14
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              Y: 2020
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