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Author Correction: A quantitative approach for trap analysis between Al0.25Ga0.75N and GaN in high electron mobility transistors.

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Title: Author Correction: A quantitative approach for trap analysis between Al0.25Ga0.75N and GaN in high electron mobility transistors.
Authors: Amir W; Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea., Shin JW; Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea., Shin KY; Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea., Kim JM; Korea Advanced Nano Fab Center, Suwon, Gyeonggi‑do, 16229, Korea., Cho CY; Korea Advanced Nano Fab Center, Suwon, Gyeonggi‑do, 16229, Korea., Park KH; Korea Advanced Nano Fab Center, Suwon, Gyeonggi‑do, 16229, Korea., Hoshi T; NTT Device Technology Laboratories, NTT Corporation, Atsugi, Kanagawa, 243‑0198, Japan., Tsutsumi T; NTT Device Technology Laboratories, NTT Corporation, Atsugi, Kanagawa, 243‑0198, Japan., Sugiyama H; NTT Device Technology Laboratories, NTT Corporation, Atsugi, Kanagawa, 243‑0198, Japan., Matsuzaki H; NTT Device Technology Laboratories, NTT Corporation, Atsugi, Kanagawa, 243‑0198, Japan., Kim TW; Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea. twkim78@ulsan.ac.kr.
Source: Scientific reports [Sci Rep] 2021 Dec 02; Vol. 11 (1), pp. 23667. Date of Electronic Publication: 2021 Dec 02.
Publication Type: Published Erratum
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Author Correction: A quantitative approach for trap analysis between Al<subscript>0.25</subscript>Ga<subscript>0.75</subscript>N and GaN in high electron mobility transistors.
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  Data: <searchLink fieldCode="AU" term="%22Amir+W%22">Amir W</searchLink>; Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea.<br /><searchLink fieldCode="AU" term="%22Shin+JW%22">Shin JW</searchLink>; Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea.<br /><searchLink fieldCode="AU" term="%22Shin+KY%22">Shin KY</searchLink>; Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea.<br /><searchLink fieldCode="AU" term="%22Kim+JM%22">Kim JM</searchLink>; Korea Advanced Nano Fab Center, Suwon, Gyeonggi‑do, 16229, Korea.<br /><searchLink fieldCode="AU" term="%22Cho+CY%22">Cho CY</searchLink>; Korea Advanced Nano Fab Center, Suwon, Gyeonggi‑do, 16229, Korea.<br /><searchLink fieldCode="AU" term="%22Park+KH%22">Park KH</searchLink>; Korea Advanced Nano Fab Center, Suwon, Gyeonggi‑do, 16229, Korea.<br /><searchLink fieldCode="AU" term="%22Hoshi+T%22">Hoshi T</searchLink>; NTT Device Technology Laboratories, NTT Corporation, Atsugi, Kanagawa, 243‑0198, Japan.<br /><searchLink fieldCode="AU" term="%22Tsutsumi+T%22">Tsutsumi T</searchLink>; NTT Device Technology Laboratories, NTT Corporation, Atsugi, Kanagawa, 243‑0198, Japan.<br /><searchLink fieldCode="AU" term="%22Sugiyama+H%22">Sugiyama H</searchLink>; NTT Device Technology Laboratories, NTT Corporation, Atsugi, Kanagawa, 243‑0198, Japan.<br /><searchLink fieldCode="AU" term="%22Matsuzaki+H%22">Matsuzaki H</searchLink>; NTT Device Technology Laboratories, NTT Corporation, Atsugi, Kanagawa, 243‑0198, Japan.<br /><searchLink fieldCode="AU" term="%22Kim+TW%22">Kim TW</searchLink>; Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, 44610, Korea. twkim78@ulsan.ac.kr.
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  Data: <searchLink fieldCode="JN" term="%22101563288%22">Scientific reports</searchLink> [Sci Rep] 2021 Dec 02; Vol. 11 (1), pp. 23667. <i>Date of Electronic Publication: </i>2021 Dec 02.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Nature+Publishing+Group%22">Nature Publishing Group </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101563288 <i>Publication Model: </i>Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2045-2322 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2220452322%22">20452322 </searchLink><i>NLM ISO Abbreviation: </i>Sci Rep <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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