| Authors: |
Sun C; Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ON, Canada., Revilla EM; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States., Zhang J; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States., Fontaine K; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States., Toyonaga T; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States., Gallezot JD; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States., Mulnix T; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States., Onofrey JA; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States; Department of Urology, Yale University, New Haven, CT, United States; Department of Biomedical Engineering, Yale University, New Haven, CT, United States., Carson RE; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States; Department of Biomedical Engineering, Yale University, New Haven, CT, United States., Lu Y; Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, United States. Electronic address: yihuan.lu@yale.edu. |
