| Authors: |
Adiani D; Computer Science, Vanderbilt University, Nashville, Tennessee, USA., Breen M; Mechanical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Migovich M; Mechanical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Wade J; Mechanical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Hunt S; Mechanical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Tauseef M; Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee, USA., Khan N; Computer Science, Vanderbilt University, Nashville, Tennessee, USA., Colopietro K; Mechanical Engineering, Vanderbilt University, Nashville, Tennessee, USA., Lanthier M; TRIAD, Vanderbilt University Medical Center, Nashville, Tennessee, USA., Swanson A; TRIAD, Vanderbilt University Medical Center, Nashville, Tennessee, USA., Vogus TJ; Owen School of Management, Vanderbilt University, Nashville, Tennessee, USA., Sarkar N; Computer Science, Vanderbilt University, Nashville, Tennessee, USA.; Mechanical Engineering, Vanderbilt University, Nashville, Tennessee, USA.; Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee, USA. |
