| Authors: |
Huang F; Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States., Saini B; Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States., Yu Z; Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States., Yoo C; Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States.; SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States., Thampy V; SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States., He X; Electron Microscopy Core Facility and Department of Mechanical and Aerospace Engineering, University of Missouri, Columbia, Missouri 65211, United States., Baniecki JD; SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States., Tsai W; Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States., Meng AC; Department of Physics and Astronomy, University of Missouri, Columbia, Missouri 65211, United States., McIntyre PC; Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States.; SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States., Wong S; Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States. |
