| Authors: |
Takaba K; RIKEN SPring-8 Center, Sayo, Hyogo, Japan., Maki-Yonekura S; RIKEN SPring-8 Center, Sayo, Hyogo, Japan., Inoue I; RIKEN SPring-8 Center, Sayo, Hyogo, Japan., Tono K; RIKEN SPring-8 Center, Sayo, Hyogo, Japan.; Japan Synchrotron Radiation Research Institute, Sayo, Hyogo, Japan., Hamaguchi T; RIKEN SPring-8 Center, Sayo, Hyogo, Japan.; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Aoba-ku, Japan., Kawakami K; RIKEN SPring-8 Center, Sayo, Hyogo, Japan., Naitow H; RIKEN SPring-8 Center, Sayo, Hyogo, Japan., Ishikawa T; RIKEN SPring-8 Center, Sayo, Hyogo, Japan., Yabashi M; RIKEN SPring-8 Center, Sayo, Hyogo, Japan.; Japan Synchrotron Radiation Research Institute, Sayo, Hyogo, Japan., Yonekura K; RIKEN SPring-8 Center, Sayo, Hyogo, Japan. yone@spring8.or.jp.; Advanced Electron Microscope Development Unit, RIKEN-JEOL Collaboration Center, RIKEN Baton Zone Program, Sayo, Hyogo, Japan. yone@spring8.or.jp.; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Aoba-ku, Japan. yone@spring8.or.jp. |