Depth-enhanced high-throughput microscopy by compact PSF engineering.

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Bibliographic Details
Title: Depth-enhanced high-throughput microscopy by compact PSF engineering.
Authors: Opatovski N; Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology, Haifa, Israel., Nehme E; Department of Biomedical Engineering, Technion - Israel Institute of Technology, Haifa, Israel.; Department of Electrical and Computer Engineering, Technion - Israel Institute of Technology, Haifa, Israel., Zoref N; Department of Biomedical Engineering, Technion - Israel Institute of Technology, Haifa, Israel., Barzilai I; Department of Biomedical Engineering, Technion - Israel Institute of Technology, Haifa, Israel., Orange Kedem R; Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology, Haifa, Israel., Ferdman B; Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology, Haifa, Israel., Keselman P; Sartorius Stedim North America Inc., Bohemia, NY, USA., Alalouf O; Department of Biomedical Engineering, Technion - Israel Institute of Technology, Haifa, Israel., Shechtman Y; Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology, Haifa, Israel. yoavsh@technion.ac.il.; Department of Biomedical Engineering, Technion - Israel Institute of Technology, Haifa, Israel. yoavsh@technion.ac.il.; Department of Mechanical Engineering, University of Texas at Austin, Austin, TX, USA. yoavsh@technion.ac.il.
Source: Nature communications [Nat Commun] 2024 Jun 07; Vol. 15 (1), pp. 4861. Date of Electronic Publication: 2024 Jun 07.
Publication Type: Journal Article
Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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ISSN:2041-1723
DOI:10.1038/s41467-024-48502-y