APA (7th ed.) Citation

S, L., TW, K., T, P., YS, H., S, Y., H, S., . . . JU, L. (2024). Large-Scale Analysis of Defects in Atomically Thin Semiconductors using Hyperspectral Line Imaging. Small (Weinheim an der Bergstrasse, Germany), 20(42), e2400737. https://doi.org/10.1002/smll.202400737

Chicago Style (17th ed.) Citation

S, Lim, Kim TW, Park T, Heo YS, Yang S, Seo H, Suh J, and Lee JU. "Large-Scale Analysis of Defects in Atomically Thin Semiconductors Using Hyperspectral Line Imaging." Small (Weinheim an Der Bergstrasse, Germany) 20, no. 42 (2024): e2400737. https://doi.org/10.1002/smll.202400737.

MLA (9th ed.) Citation

S, Lim, et al. "Large-Scale Analysis of Defects in Atomically Thin Semiconductors Using Hyperspectral Line Imaging." Small (Weinheim an Der Bergstrasse, Germany), vol. 20, no. 42, 2024, p. e2400737, https://doi.org/10.1002/smll.202400737.