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Large-Scale Analysis of Defects in Atomically Thin Semiconductors using Hyperspectral Line Imaging.

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Title: Large-Scale Analysis of Defects in Atomically Thin Semiconductors using Hyperspectral Line Imaging.
Authors: Lim S; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Kim TW; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Park T; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Heo YS; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Yang S; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea.; Department of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea., Seo H; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Suh J; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea.; Department of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea., Lee JU; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea.
Source: Small (Weinheim an der Bergstrasse, Germany) [Small] 2024 Oct; Vol. 20 (42), pp. e2400737. Date of Electronic Publication: 2024 Jun 14.
Publication Type: Journal Article
Journal Info: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 101235338 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1613-6829 (Electronic) Linking ISSN: 16136810 NLM ISO Abbreviation: Small Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Large-Scale Analysis of Defects in Atomically Thin Semiconductors using Hyperspectral Line Imaging.
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  Data: <searchLink fieldCode="AU" term="%22Lim+S%22">Lim S</searchLink>; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea.<br /><searchLink fieldCode="AU" term="%22Kim+TW%22">Kim TW</searchLink>; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea.<br /><searchLink fieldCode="AU" term="%22Park+T%22">Park T</searchLink>; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea.<br /><searchLink fieldCode="AU" term="%22Heo+YS%22">Heo YS</searchLink>; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea.<br /><searchLink fieldCode="AU" term="%22Yang+S%22">Yang S</searchLink>; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea.; Department of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea.<br /><searchLink fieldCode="AU" term="%22Seo+H%22">Seo H</searchLink>; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea.<br /><searchLink fieldCode="AU" term="%22Suh+J%22">Suh J</searchLink>; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea.; Department of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea.<br /><searchLink fieldCode="AU" term="%22Lee+JU%22">Lee JU</searchLink>; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea.
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  Data: <searchLink fieldCode="JN" term="%22101235338%22">Small (Weinheim an der Bergstrasse, Germany)</searchLink> [Small] 2024 Oct; Vol. 20 (42), pp. e2400737. <i>Date of Electronic Publication: </i>2024 Jun 14.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Wiley-VCH%22">Wiley-VCH </searchLink><i>Country of Publication: </i>Germany <i>NLM ID: </i>101235338 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1613-6829 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2216136810%22">16136810 </searchLink><i>NLM ISO Abbreviation: </i>Small <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1002/smll.202400737
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        StartPage: e2400737
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      – TitleFull: Large-Scale Analysis of Defects in Atomically Thin Semiconductors using Hyperspectral Line Imaging.
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              Text: 2024 Oct
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              Y: 2024
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