Large-Scale Analysis of Defects in Atomically Thin Semiconductors using Hyperspectral Line Imaging.
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| Title: | Large-Scale Analysis of Defects in Atomically Thin Semiconductors using Hyperspectral Line Imaging. |
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| Authors: | Lim S; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Kim TW; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Park T; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Heo YS; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Yang S; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea.; Department of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea., Seo H; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea., Suh J; Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea.; Department of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology, Ulsan, 44919, South Korea., Lee JU; Department of Physics and Department of Energy Systems Research, Ajou University, Suwon, 16499, South Korea. |
| Source: | Small (Weinheim an der Bergstrasse, Germany) [Small] 2024 Oct; Vol. 20 (42), pp. e2400737. Date of Electronic Publication: 2024 Jun 14. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 101235338 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1613-6829 (Electronic) Linking ISSN: 16136810 NLM ISO Abbreviation: Small Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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