View in EDS

Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.

Saved in:
Bibliographic Details
Title: Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.
Authors: Agarwal A; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Kasaei L; Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854., He X; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Kitichotkul R; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Hitit OK; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Peng M; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Schultz JA; Ionwerks Inc., Houston, TX 77005., Feldman LC; Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854., Goyal VK; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215.
Source: Proceedings of the National Academy of Sciences of the United States of America [Proc Natl Acad Sci U S A] 2024 Jul 30; Vol. 121 (31), pp. e2401246121. Date of Electronic Publication: 2024 Jul 25.
Publication Type: Journal Article
Journal Info: Publisher: National Academy of Sciences Country of Publication: United States NLM ID: 7505876 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1091-6490 (Electronic) Linking ISSN: 00278424 NLM ISO Abbreviation: Proc Natl Acad Sci U S A Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1091-6490
DOI:10.1073/pnas.2401246121