A, A., L, K., X, H., R, K., OK, H., M, P., . . . VK, G. (2024). Shot noise-mitigated secondary electron imaging with ion count-aided microscopy. Proceedings of the National Academy of Sciences of the United States of America, 121(31), e2401246121. https://doi.org/10.1073/pnas.2401246121
Chicago Style (17th ed.) CitationA, Agarwal, Kasaei L, He X, Kitichotkul R, Hitit OK, Peng M, Schultz JA, Feldman LC, and Goyal VK. "Shot Noise-mitigated Secondary Electron Imaging with Ion Count-aided Microscopy." Proceedings of the National Academy of Sciences of the United States of America 121, no. 31 (2024): e2401246121. https://doi.org/10.1073/pnas.2401246121.
MLA (9th ed.) CitationA, Agarwal, et al. "Shot Noise-mitigated Secondary Electron Imaging with Ion Count-aided Microscopy." Proceedings of the National Academy of Sciences of the United States of America, vol. 121, no. 31, 2024, p. e2401246121, https://doi.org/10.1073/pnas.2401246121.
