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Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.

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Title: Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.
Authors: Agarwal A; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Kasaei L; Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854., He X; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Kitichotkul R; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Hitit OK; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Peng M; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Schultz JA; Ionwerks Inc., Houston, TX 77005., Feldman LC; Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854., Goyal VK; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215.
Source: Proceedings of the National Academy of Sciences of the United States of America [Proc Natl Acad Sci U S A] 2024 Jul 30; Vol. 121 (31), pp. e2401246121. Date of Electronic Publication: 2024 Jul 25.
Publication Type: Journal Article
Journal Info: Publisher: National Academy of Sciences Country of Publication: United States NLM ID: 7505876 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1091-6490 (Electronic) Linking ISSN: 00278424 NLM ISO Abbreviation: Proc Natl Acad Sci U S A Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.
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  Data: <searchLink fieldCode="AU" term="%22Agarwal+A%22">Agarwal A</searchLink>; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215.<br /><searchLink fieldCode="AU" term="%22Kasaei+L%22">Kasaei L</searchLink>; Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854.<br /><searchLink fieldCode="AU" term="%22He+X%22">He X</searchLink>; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215.<br /><searchLink fieldCode="AU" term="%22Kitichotkul+R%22">Kitichotkul R</searchLink>; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215.<br /><searchLink fieldCode="AU" term="%22Hitit+OK%22">Hitit OK</searchLink>; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215.<br /><searchLink fieldCode="AU" term="%22Peng+M%22">Peng M</searchLink>; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215.<br /><searchLink fieldCode="AU" term="%22Schultz+JA%22">Schultz JA</searchLink>; Ionwerks Inc., Houston, TX 77005.<br /><searchLink fieldCode="AU" term="%22Feldman+LC%22">Feldman LC</searchLink>; Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854.<br /><searchLink fieldCode="AU" term="%22Goyal+VK%22">Goyal VK</searchLink>; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215.
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  Data: <searchLink fieldCode="JN" term="%227505876%22">Proceedings of the National Academy of Sciences of the United States of America</searchLink> [Proc Natl Acad Sci U S A] 2024 Jul 30; Vol. 121 (31), pp. e2401246121. <i>Date of Electronic Publication: </i>2024 Jul 25.
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              Text: 2024 Jul 30
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