Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.
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| Title: | Shot noise-mitigated secondary electron imaging with ion count-aided microscopy. |
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| Authors: | Agarwal A; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Kasaei L; Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854., He X; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Kitichotkul R; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Hitit OK; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Peng M; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215., Schultz JA; Ionwerks Inc., Houston, TX 77005., Feldman LC; Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854., Goyal VK; Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215. |
| Source: | Proceedings of the National Academy of Sciences of the United States of America [Proc Natl Acad Sci U S A] 2024 Jul 30; Vol. 121 (31), pp. e2401246121. Date of Electronic Publication: 2024 Jul 25. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: National Academy of Sciences Country of Publication: United States NLM ID: 7505876 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1091-6490 (Electronic) Linking ISSN: 00278424 NLM ISO Abbreviation: Proc Natl Acad Sci U S A Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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