| Authors: |
Bang J; Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, South Korea.; National High Magnetic Field Laboratory, Tallahassee, FL, 32310, USA., Kim J; Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, South Korea. jmkim.snu@snu.ac.kr., Jang JY; School of Electrical, Electronics and Communication Engineering, Korea University of Technology and Education (KOREATECH), Cheonan, 31253, South Korea., Ahn M; Department of Electrical Engineering, Kunsan National University, Gunsan, 54150, South Korea., Hwang YJ; Division of Electronics and Electrical Information Engineering, National Korea Maritime & Ocean University, Busan, 49112, South Korea., Kim K; National High Magnetic Field Laboratory, Tallahassee, FL, 32310, USA., Kim Y; SuNAM, 52 Seungnyang-gil, Wongok-myeon, Anseong-si, Gyeonggi-do, 17554, South Korea., Ku M; SuNAM, 52 Seungnyang-gil, Wongok-myeon, Anseong-si, Gyeonggi-do, 17554, South Korea., Lee H; SuNAM, 52 Seungnyang-gil, Wongok-myeon, Anseong-si, Gyeonggi-do, 17554, South Korea., In S; Department of Extreme Energy System, Korea Institute of Machinery and Materials, Daejeon, 34103, South Korea., Hong YJ; Department of Extreme Energy System, Korea Institute of Machinery and Materials, Daejeon, 34103, South Korea., Yeom H; Department of Extreme Energy System, Korea Institute of Machinery and Materials, Daejeon, 34103, South Korea., Lee JT; Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, South Korea., Yang H; Korea Basic Science Institute, Gwangju Center, Chengju-si, Chungcheongbuk-do, 28119, South Korea., Hahn S; Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, South Korea. hahnsy@snu.ac.kr., Lee S; Korea Basic Science Institute, Gwangju Center, Chengju-si, Chungcheongbuk-do, 28119, South Korea. |
