| Authors: |
Usuda J; Department of Electronics, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan. takahashi.yasufumi.v5@f.mail.nagoya-u.ac.jp., Yagyu K; Department of Electronics, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan. takahashi.yasufumi.v5@f.mail.nagoya-u.ac.jp., Tanaka H; Center for Low-Temperature Plasma Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan., Hori M; Center for Low-Temperature Plasma Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan., Ishikawa K; Center for Low-Temperature Plasma Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan., Takahashi Y; Department of Electronics, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan. takahashi.yasufumi.v5@f.mail.nagoya-u.ac.jp.; Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Kanazawa 920-1192, Japan. |