| Authors: |
Yang H; College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, East Third Road 1, Erxian Bridge, 610059, Chengdu, China; Institute of Applied Electronics, China Academy of Engineering Physics, Mian Shan Road 64, 621900, Mianyang, China., Yang X; Institute of Applied Electronics, China Academy of Engineering Physics, Mian Shan Road 64, 621900, Mianyang, China., Tang Y; College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, East Third Road 1, Erxian Bridge, 610059, Chengdu, China., Dai H; College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, East Third Road 1, Erxian Bridge, 610059, Chengdu, China., Li P; College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, East Third Road 1, Erxian Bridge, 610059, Chengdu, China., Liang G; College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, East Third Road 1, Erxian Bridge, 610059, Chengdu, China., Wu Y; School of Computer Science and Engineering, Sichuan University of Science and Engineering, Huixing Road 519, Ziliujing District, 643000, Zigong, China., Tuo X; College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, East Third Road 1, Erxian Bridge, 610059, Chengdu, China; School of Physics and Electronic Engineering, Sichuan University of Science and Engineering, Huixing Road 519, Ziliujing District, 643000, Zigong, China., Wang Q; School of Physics and Electronic Engineering, Sichuan University of Science and Engineering, Huixing Road 519, Ziliujing District, 643000, Zigong, China. Electronic address: wangqibiao@suse.edu.cn. |
