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Effects of subjective stress levels on learning effectiveness in high-fidelity simulation among healthcare workers.

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Title: Effects of subjective stress levels on learning effectiveness in high-fidelity simulation among healthcare workers.
Authors: Suh YA; Department of Paediatrics, Ajou University School of Medicine, 164 World Cup-ro, Yeongtong-gu, Suwon 16499, South Korea. Electronic address: mary5531@aumc.ac.kr., Shim H; Department of Simulation Center, Hallym University Dongtan Sacred Heart Hospital, 312 Digital Station Building, 160, Samsung1-ro, Hwasung-si, Gyeonggi-Do 18450, South Korea., Lee HJ; Department of Paediatrics, Samsung Changwon Hospital, Sungkyunkwan University School of Medicine. Changwon, South Korea., Lee JH; Department of Paediatrics, Ajou University School of Medicine, 164 World Cup-ro, Yeongtong-gu, Suwon 16499, South Korea. Electronic address: neopedlee@aumc.ac.kr., Park MS; Department of Paediatrics, Ajou University School of Medicine, 164 World Cup-ro, Yeongtong-gu, Suwon 16499, South Korea. Electronic address: drparkms@aumc.ac.kr., Choi S; Department of Paediatrics, Ajou University School of Medicine, 164 World Cup-ro, Yeongtong-gu, Suwon 16499, South Korea. Electronic address: shchoi@aumc.ac.kr.
Source: Acta psychologica [Acta Psychol (Amst)] 2025 Jul; Vol. 257, pp. 105075. Date of Electronic Publication: 2025 Jun 04.
Publication Type: Journal Article; Randomized Controlled Trial
Journal Info: Publisher: North Holland Publishing Country of Publication: Netherlands NLM ID: 0370366 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1873-6297 (Electronic) Linking ISSN: 00016918 NLM ISO Abbreviation: Acta Psychol (Amst) Subsets: MEDLINE
Database: MEDLINE Ultimate
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  Data: Effects of subjective stress levels on learning effectiveness in high-fidelity simulation among healthcare workers.
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  Data: <searchLink fieldCode="AU" term="%22Suh+YA%22">Suh YA</searchLink>; Department of Paediatrics, Ajou University School of Medicine, 164 World Cup-ro, Yeongtong-gu, Suwon 16499, South Korea. Electronic address: mary5531@aumc.ac.kr.<br /><searchLink fieldCode="AU" term="%22Shim+H%22">Shim H</searchLink>; Department of Simulation Center, Hallym University Dongtan Sacred Heart Hospital, 312 Digital Station Building, 160, Samsung1-ro, Hwasung-si, Gyeonggi-Do 18450, South Korea.<br /><searchLink fieldCode="AU" term="%22Lee+HJ%22">Lee HJ</searchLink>; Department of Paediatrics, Samsung Changwon Hospital, Sungkyunkwan University School of Medicine. Changwon, South Korea.<br /><searchLink fieldCode="AU" term="%22Lee+JH%22">Lee JH</searchLink>; Department of Paediatrics, Ajou University School of Medicine, 164 World Cup-ro, Yeongtong-gu, Suwon 16499, South Korea. Electronic address: neopedlee@aumc.ac.kr.<br /><searchLink fieldCode="AU" term="%22Park+MS%22">Park MS</searchLink>; Department of Paediatrics, Ajou University School of Medicine, 164 World Cup-ro, Yeongtong-gu, Suwon 16499, South Korea. Electronic address: drparkms@aumc.ac.kr.<br /><searchLink fieldCode="AU" term="%22Choi+S%22">Choi S</searchLink>; Department of Paediatrics, Ajou University School of Medicine, 164 World Cup-ro, Yeongtong-gu, Suwon 16499, South Korea. Electronic address: shchoi@aumc.ac.kr.
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  Data: <searchLink fieldCode="JN" term="%220370366%22">Acta psychologica</searchLink> [Acta Psychol (Amst)] 2025 Jul; Vol. 257, pp. 105075. <i>Date of Electronic Publication: </i>2025 Jun 04.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22North+Holland+Publishing%22">North Holland Publishing </searchLink><i>Country of Publication: </i>Netherlands <i>NLM ID: </i>0370366 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1873-6297 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2200016918%22">00016918 </searchLink><i>NLM ISO Abbreviation: </i>Acta Psychol (Amst) <i>Subsets: </i>MEDLINE
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        Value: 10.1016/j.actpsy.2025.105075
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      – TitleFull: Effects of subjective stress levels on learning effectiveness in high-fidelity simulation among healthcare workers.
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              Text: 2025 Jul
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