An Investigation on Cross-Tracer Generalizability of Deep Learning-based PET Attenuation Correction.

Saved in:
Bibliographic Details
Title: An Investigation on Cross-Tracer Generalizability of Deep Learning-based PET Attenuation Correction.
Authors: Hou J; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Chen T; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Zhou Y; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Chen X; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Xie H; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Liu Q; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Xia M; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Panin VY; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Toyonaga T; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Liu C; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA., Zhou B; J. Hou and T. Chen are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. Y. Zhou, X. Chen, H. Xie, Q. Liu, and M. Xia are with the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA. V. Y. Panin is with Siemens Medical Solutions USA Inc, Knoxville, TN, USA. T. Toyonaga is with the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. C. Liu is with the Department of Biomedical Engineering and the Department of Radiology and Biomedical Imaging, Yale University, New Haven, CT, 06511, USA. B. Zhou is with the Department of Radiology, Northwestern University, Chicago, IL, 60611, USA, and the Department of Biomedical Engineering, Yale University, New Haven, CT, 06511, USA.
Source: IEEE transactions on radiation and plasma medical sciences [IEEE Trans Radiat Plasma Med Sci] 2025 Nov; Vol. 9 (8), pp. 1025-1035. Date of Electronic Publication: 2025 May 02.
Publication Type: Journal Article
Journal Info: Publisher: IEEE Country of Publication: United States NLM ID: 101705223 Publication Model: Print-Electronic Cited Medium: Print ISSN: 2469-7311 (Print) Linking ISSN: 24697303 NLM ISO Abbreviation: IEEE Trans Radiat Plasma Med Sci Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2469-7311
DOI:10.1109/trpms.2025.3566630