Harnessing Trial-to-Trial Variability of EEG Spectral Characteristics to Understand Autism.

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Title: Harnessing Trial-to-Trial Variability of EEG Spectral Characteristics to Understand Autism.
Authors: M Shama D; Electrical and Computer Engineering, Boston University, 8 St Mary's St, Boston, MA, 02215, USA. dshama1@jhu.edu.; Electrical and Computer Engineering, Johns Hopkins University, 3400 N Charles St, Baltimore, MA, 21218, USA. dshama1@jhu.edu., Su M; Electrical and Computer Engineering, Boston University, 8 St Mary's St, Boston, MA, 02215, USA., Beeler-Duden S; Department of Neurology, University of Virginia, 1340 Jefferson Park Ave, Charlottesville, VA, 22903, USA., Bernier RA; Department of Psychiatry and Behavioral Science, University of Washington, 1959 NE Pacific Street, Seattle, WA, 98195, USA., Bookheimer SY; Center for Autism Research and Treatment, David Geffen School of Medicine, University of California Los Angeles, 757 Westwood Plaza, Los Angeles, CA, 90095, USA.; Department of Psychiatry and Biobehavioral Sciences, David Geffen School of Medicine, University of California Los Angeles, 757 Westwood Plaza, Los Angeles, CA, 90095, USA., Dapretto M; Center for Autism Research and Treatment, David Geffen School of Medicine, University of California Los Angeles, 757 Westwood Plaza, Los Angeles, CA, 90095, USA.; Department of Psychiatry and Biobehavioral Sciences, David Geffen School of Medicine, University of California Los Angeles, 757 Westwood Plaza, Los Angeles, CA, 90095, USA., McPartland JC; Yale Child Study Center, Yale School of Medicine, 50 George Street, New Haven, CT, 06511, USA., Jeste S; Department of Neurology, Children s Hospital of Los Angeles, 4650 Sunset Blvd, Los Angeles, CA, 90027, USA., Horn JDV; Department of Psychology, University of Virginia, 409 McCormick Rd, Charlottesville, VA, 22903, USA.; School of Data Science, University of Virginia, 1919 Ivy Rd, Charlottesville, VA, 22903, USA., Pelphrey K; Department of Neurology, University of Virginia, 1340 Jefferson Park Ave, Charlottesville, VA, 22903, USA., Venkataraman A; Electrical and Computer Engineering, Boston University, 8 St Mary's St, Boston, MA, 02215, USA.; Electrical and Computer Engineering, Johns Hopkins University, 3400 N Charles St, Baltimore, MA, 21218, USA.
Source: Journal of autism and developmental disorders [J Autism Dev Disord] 2025 Nov 22. Date of Electronic Publication: 2025 Nov 22.
Publication Type: Journal Article
Journal Info: Publisher: Springer Country of Publication: United States NLM ID: 7904301 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1573-3432 (Electronic) Linking ISSN: 01623257 NLM ISO Abbreviation: J Autism Dev Disord Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1573-3432
DOI:10.1007/s10803-025-07125-y