S, L., CL, G., A, T., M, M., F, d. l. P., AM, B., . . . H, L. (2026). STEM-EELS study of beam damage in polymers and extra-terrestrial organic matter using direct electron detectors. Ultramicroscopy, 282, 114309. https://doi.org/10.1016/j.ultramic.2026.114309
Chicago Style (17th ed.) CitationS, Laforet, Guillou CL, Teurtrie A, Marinova M, de la Peña F, Blanchenet AM, Bernard S, and Leroux H. "STEM-EELS Study of Beam Damage in Polymers and Extra-terrestrial Organic Matter Using Direct Electron Detectors." Ultramicroscopy 282 (2026): 114309. https://doi.org/10.1016/j.ultramic.2026.114309.
MLA (9th ed.) CitationS, Laforet, et al. "STEM-EELS Study of Beam Damage in Polymers and Extra-terrestrial Organic Matter Using Direct Electron Detectors." Ultramicroscopy, vol. 282, 2026, p. 114309, https://doi.org/10.1016/j.ultramic.2026.114309.