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Cognitive neurobehavior and synaptic plasticity after vagus nerve stimulation in female rats: Interaction between estrous cycle and neurostimulation.

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Title: Cognitive neurobehavior and synaptic plasticity after vagus nerve stimulation in female rats: Interaction between estrous cycle and neurostimulation.
Authors: Olsen LK; Cognitive Neuroscience, 711th HPW, AFRL, Wright-Patterson AFB, Dayton, OH, USA. laura.olsen.1.ctr@us.af.mil.; Oak Ridge Institute for Science and Education, Oak Ridge, TN, USA. laura.olsen.1.ctr@us.af.mil.; Airmen Biosciences Division, 711th Human Performance Wing, Air Force Research Laboratory, Wright-Patterson AFB, Dayton, OH, 45433, USA. laura.olsen.1.ctr@us.af.mil., Jones KA; Cognitive Neuroscience, 711th HPW, AFRL, Wright-Patterson AFB, Dayton, OH, USA.; BlueHalo, Inc., Dayton, OH, USA., Sharma B; Cognitive Neuroscience, 711th HPW, AFRL, Wright-Patterson AFB, Dayton, OH, USA.; Oak Ridge Institute for Science and Education, Oak Ridge, TN, USA., Ethridge VT; Naval Medical Research Unit Dayton, Wright-Patterson AFB, Dayton, OH, USA.; Leidos Inc., Reston, Fairfax County, VA, USA., Gargas NM; Naval Medical Research Unit Dayton, Wright-Patterson AFB, Dayton, OH, USA.; Leidos Inc., Reston, Fairfax County, VA, USA., Cunningham SD; Cognitive Neuroscience, 711th HPW, AFRL, Wright-Patterson AFB, Dayton, OH, USA.; Oak Ridge Institute for Science and Education, Oak Ridge, TN, USA., Rohan JG; Naval Medical Research Unit Dayton, Wright-Patterson AFB, Dayton, OH, USA., Hatcher-Solis CN; Cognitive Neuroscience, 711th HPW, AFRL, Wright-Patterson AFB, Dayton, OH, USA.
Source: Bioelectronic medicine [Bioelectron Med] 2026 Feb 02; Vol. 12 (1), pp. 4. Date of Electronic Publication: 2026 Feb 02.
Publication Type: Journal Article
Journal Info: Publisher: BMC Country of Publication: England NLM ID: 101660849 Publication Model: Electronic Cited Medium: Internet ISSN: 2332-8886 (Electronic) Linking ISSN: 23328886 NLM ISO Abbreviation: Bioelectron Med Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2332-8886
DOI:10.1186/s42234-025-00196-3