| Authors: |
Bucher T; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Gorlach A; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Niedermayr A; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Yan Q; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Nahari H; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Wang K; Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China., Ruimy R; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Adiv Y; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Yannai M; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Abudi TL; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel., Janzen E; Tim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, KS, USA., Spaegele C; Harvard John A. Paulson School of Engineering and Applied Sciences, Harvard University, Cambridge, MA, USA., Roques-Carmes C; E. L. Ginzton Laboratory, Stanford University, Stanford, CA, USA., Edgar JH; Tim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, KS, USA., Koppens FHL; ICFO-Institut de Ciències Fotòniquses, The Barcelona Institute of Science and Technology, Castelldefels, Spain.; ICREA-Institució Catalana de Recerca i Estudis Avancats, Barcelona, Spain., Vanacore GM; Department of Materials Science, University of Milano-Bicocca, Milano, Italy., H Sheinfux H; Department of Physics, Bar-Ilan University, Ramat Gan, Israel., Tsesses S; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel.; Department of Physics, MIT-Harvard Center for Ultracold Atoms and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA., Kaminer I; Andrea and Erna Viterbi Department of Electrical and Computer Engineering, Technion-Israel Institute of Technology, Haifa, Israel. kaminer@technion.ac.il.; Faculty of Materials Science and Engineering, Technion-Israel Institute of Technology, Haifa, Israel. kaminer@technion.ac.il. |
