| Authors: |
Park JY; Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, College of Engineering, Seoul National University, Seoul, Republic of Korea., Lee JH; Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, College of Engineering, Seoul National University, Seoul, Republic of Korea., Lee JM; Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, College of Engineering, Seoul National University, Seoul, Republic of Korea., Park KN; Department of Electronic Engineering, College of Engineering, Hanyang University, Seoul, Republic of Korea., Kim S; Division of Electronic and Semiconductor Engineering, College of Engineering, Ewha Womans University, Seoul, Republic of Korea., Han JK; Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, College of Engineering, Seoul National University, Seoul, Republic of Korea. joonkyuhan@snu.ac.kr. |
