| Authors: |
Ohira S; Analysis Technology Center, FUJIFILM Corporation, 210, Nakamuma, Minamiashigara-shi, Kanagawa 250-0193, Japan., Doi I; Analysis Technology Center, FUJIFILM Corporation, 210, Nakamuma, Minamiashigara-shi, Kanagawa 250-0193, Japan., Nakabayashi J; Analysis Technology Center, FUJIFILM Corporation, 210, Nakamuma, Minamiashigara-shi, Kanagawa 250-0193, Japan., Tanaka H; CRO Business Development Office, FUJIFILM Corporation, 7-3, Akasaka 9-Chome, Minato-ku, Tokyo 107-0052, Japan., Sonoda Y; Analysis Technology Center, FUJIFILM Corporation, 210, Nakamuma, Minamiashigara-shi, Kanagawa 250-0193, Japan., Ammar YB; Analysis Technology Center, FUJIFILM Corporation, 210, Nakamuma, Minamiashigara-shi, Kanagawa 250-0193, Japan., Kochi M; Analysis Technology Center, FUJIFILM Corporation, 210, Nakamuma, Minamiashigara-shi, Kanagawa 250-0193, Japan., Tanaka T; CRO Business Development Office, FUJIFILM Corporation, 7-3, Akasaka 9-Chome, Minato-ku, Tokyo 107-0052, Japan., Tsumura K; Analysis Technology Center, FUJIFILM Corporation, 210, Nakamuma, Minamiashigara-shi, Kanagawa 250-0193, Japan. Electronic address: kyosuke.tsumura@fujifilm.com. |