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Beam teleportation for precision dose control in scanning transmission electron microscopy.

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Title: Beam teleportation for precision dose control in scanning transmission electron microscopy.
Authors: Hollenbach JD; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA., Koppell SA; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA., Smalley D; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA., Francis C; Direct Electron, LP., San Diego, 92128, CA, USA., Levin BDA; Direct Electron, LP., San Diego, 92128, CA, USA., Macy J; Pacific Northwest National Laboratory, Physical Sciences Division, Richland, 99354, WA, USA., Wang CF; Pacific Northwest National Laboratory, Physical Sciences Division, Richland, 99354, WA, USA., Reed BW; Integrated Dynamic Electron Solutions, Inc., Pleasanton, 94588, CA, USA., Taheri ML; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA; Pacific Northwest National Laboratory, Physical Sciences Division, Richland, 99354, WA, USA. Electronic address: mtaheri4@jhu.edu.
Source: Ultramicroscopy [Ultramicroscopy] 2026 Jul; Vol. 284, pp. 114371. Date of Electronic Publication: 2026 Apr 15.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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PubType: Academic Journal
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  Data: Beam teleportation for precision dose control in scanning transmission electron microscopy.
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  Data: <searchLink fieldCode="AU" term="%22Hollenbach+JD%22">Hollenbach JD</searchLink>; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA.<br /><searchLink fieldCode="AU" term="%22Koppell+SA%22">Koppell SA</searchLink>; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA.<br /><searchLink fieldCode="AU" term="%22Smalley+D%22">Smalley D</searchLink>; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA.<br /><searchLink fieldCode="AU" term="%22Francis+C%22">Francis C</searchLink>; Direct Electron, LP., San Diego, 92128, CA, USA.<br /><searchLink fieldCode="AU" term="%22Levin+BDA%22">Levin BDA</searchLink>; Direct Electron, LP., San Diego, 92128, CA, USA.<br /><searchLink fieldCode="AU" term="%22Macy+J%22">Macy J</searchLink>; Pacific Northwest National Laboratory, Physical Sciences Division, Richland, 99354, WA, USA.<br /><searchLink fieldCode="AU" term="%22Wang+CF%22">Wang CF</searchLink>; Pacific Northwest National Laboratory, Physical Sciences Division, Richland, 99354, WA, USA.<br /><searchLink fieldCode="AU" term="%22Reed+BW%22">Reed BW</searchLink>; Integrated Dynamic Electron Solutions, Inc., Pleasanton, 94588, CA, USA.<br /><searchLink fieldCode="AU" term="%22Taheri+ML%22">Taheri ML</searchLink>; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, 21218, MD, USA; Pacific Northwest National Laboratory, Physical Sciences Division, Richland, 99354, WA, USA. Electronic address: mtaheri4@jhu.edu.
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  Data: <searchLink fieldCode="JN" term="%227513702%22">Ultramicroscopy</searchLink> [Ultramicroscopy] 2026 Jul; Vol. 284, pp. 114371. <i>Date of Electronic Publication: </i>2026 Apr 15.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Elsevier%22">Elsevier </searchLink><i>Country of Publication: </i>Netherlands <i>NLM ID: </i>7513702 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1879-2723 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2203043991%22">03043991 </searchLink><i>NLM ISO Abbreviation: </i>Ultramicroscopy <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1016/j.ultramic.2026.114371
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      – Code: eng
        Text: English
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      – TitleFull: Beam teleportation for precision dose control in scanning transmission electron microscopy.
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              M: 07
              Text: 2026 Jul
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              Y: 2026
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